- Philips 410LS Transmission Electron Microscopy outfitted with capabilities for identification of particulates by electron microdiffraction, X-ray microanalysis and SIS imaging.
	- JEOL JEM 1200-EX Scanning Transmission Electron Microscopy outfitted with capabilities for identification of particulates by electron microdiffraction, X-ray microanalysis and SIS imaging.
	- JEOL JSM-35 Scanning Electron Microscopy available for high magnification imaging and chemical identification of microscopic phases by X-ray microanalysis (EDS).
	- Metorex Outokumpu X-Ray Fluorescence: Cm 1244 and Fe 55 detectors used for rapid, low-cost chemical analysis.
	- Olympus BHT-BHTU Light Microscopy available for Phase Contrast Microscopy.
	- Olympus BHT-BHS Immunofluorescent Microscope available for Fluorescent Microscopy, Phase Contrast Microscopy and Differential Intereference Contrast Microscopy with digital imaging.
	- Philips XRG-300 X-Ray Diffraction is primarily used for crystalline silica analysis.
	- Thermo Nicolet 380 FT-IR used for fingerprint indentification of polymers, organic coatings, and solvents.
	- Gas Chromatograph (GC) used for identification of PCBs, food additives, et cetera.
	- Karl Fischer (KF) titrator used for measurement of moisture to ppm level